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Verios G4 XHR SEM

The best possible low-kV SEM resolution and materials contrast

The Thermo Scientificâ„¢ Verios G4 scanning electron microscope (SEM) is geared toward increasing publishable results from your lab. The Verios SEM enables new insights by extending sub-nanometer resolution over the full 1 keV to 30 keV energy range to novel materials, such as catalyst particles, nanotubes, porosities, interfaces, biological objects, and other nanoscale structures. High-resolution, high-contrast images are obtained without the need to transition to TEM or other imaging techniques. The Verios SEM offers the flexibility required for research applications to accommodate large specimens like full wafers or metallurgical samples. You can perform fast analysis thanks to its high current mode or work on precise prototyping applications such as electron beam-induced direct deposition of materials or lithography.